GeoTek Hawaii, Inc.
alaska environmental
Seismic Refraction

Mapping of Stratigraphy, Bedrock, Groundwater, and Faults
Seismic refraction is used for investigating subsurface ground conditions utilizing surface-sourced seismic waves. The acquired data is computer processed and interpreted to produce models of the seismic velocity and layer thickness of the subsurface ground structure. This tool can be used to measure bedrock depth and overburden thickness, locate geologic structures, and define ancient landfill sites.

Determine depth and dip of bedrock
Determine competence of bedrock (for foundation design and rippability analysis)
Determine depth to groundwater
Map stratigraphy
Map faults and fracture zones
Calculate engineering properties of the overburden
Calculate material elastic constants (e.g., shear modulus, Poission’s ratio) from the shear and compressional velocity data
Fast field operation, can cover large survey areas inexpensively and rapidly
Typically requires less time and expense than comparable seismic reflection methods or drilling
Estimate material properties from acquired seismic velocity data
Greater vertical resolution than electrical, magnetic, or gravity methods
Limited intrusive activity and is non-destructive

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